Park Systems, the leading atomic force microscope (AFM) and nano-metrology solutions partner for the most accurate AFM results, cordially invites you to our booth (#B-705) at the 2012 JASIS (Japan Analytical Scientific Instruments Show). In harmony with the theme “Discover the Future,” Park would like to present the NX10, industry’s only True Non-Contact AFM with industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Park NX10 is the world’s premium research grade AFM that is user-friendly and convenient to use for new and experienced users alike. The NX platform builds on Park’s 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
- You are here:
- 홈
- 이벤트
- 유저미팅 & 전시회
- 전시회
- JASIS 2012
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