Park Systems, cordially invites you to visit our booth (#416) at 2013 ACS Spring Meeting in New Orleans, LA (April 7th ~ 11th). The exhibition will provide an excellent opportunity to learn about Park NX10, the most accurate research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Park NX10 is built on Park's 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
- You are here:
- 홈
- 이벤트
- 유저미팅 & 전시회
- 전시회
- ACS Spring Meeting 2...
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