神经形态和类脑计算具有并行处理和存储大量数据的能力且功耗低等优点,正在引起学术界和工业界的巨大关注。在本次讲座中将介绍如何利用导电原子力显微镜(CAFM)结合半导体参数分析仪(SPA)在纳米尺寸(~50 nm2)原位观测忆阻型电子突触的动态响应,以及多种可塑性行为的模拟,包括低功耗双脉冲易化、兴奋性突触后电流、长时程增强/抑制等。本工作为研究纳米尺寸突触行为的探索提供了一种新的研究方法。
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
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