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Fraunhofer IMWS and Park Systems are announcing the call for abstracts as well as opening registration for the International SPM Symposium on Failure Analysis and Material Testing - FAMT 2021

Advancing miniaturization shapes our modern high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.

Are you experiencing similar challenges in your daily work? Join us on July 1, 2021!

This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future.

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Join us as an expert and present your application study

Submit your ABSTRACT here:

Deadline: June 1, 2021


Join us and network with the semi-commnunity

Registration deadline: June 30, 2021 

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Contact:

Justyna Sliwa This email address is being protected from spambots. You need JavaScript enabled to view it.

Pernack Katja This email address is being protected from spambots. You need JavaScript enabled to view it.

 

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