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FAMT 2021 Symposium - Scope

Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials increase constantly with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.

Are you experiencing similar challenges in your daily work? Join us on July 1, 2021!

This symposium gathers the professionals from the electronic industry to discuss innovative testing methods and tools for failure analysis of the future.





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Meetings & Exhibits