Magnetic force microscopy (MFM) is an atomic force microscopy (AFM) application that is widely used to characterize magnetic properties of various materials at the nanoscale. In this technique, a sharp tip coated with ferromagnetic material scans the surface and maps the distribution and strength of magnetic domains on the sample. MFM mode can be applied to probe the properties of magnetic materials for academic and applied research, e.g. to characterize, evaluate, and develop magnetic storage devices and magnetic recording components such as hard disk media, and magneto-resistive heads as well as to image naturally occurring or deliberately written domain structures in magnetic materials.
MFM mode uses Non-contact mode to detect the surface topography of the sample. At the same time, the MFM image is generated by measuring the amplitude and phase of cantilever oscillation. These signals contain information about magnetic domain distributions of the sample surface. MFM can be used to image naturally occurring or deliberately written domain structures in magnetic materials.
In this webinar, we will present an introduction on MFM principle and applications followed by live demo by our AFM expert.