The atomic force microscope (AFM) is one of the necessary tool for mapping the nanoscale properties of a material, and hence its operation should be simple. However, one of the reasons why AFMs require an experienced user is that most conventional AFMs require complicated operation to acquire images, and conventional AFM software is difficult to set up and operate. Such AFM operations necessitate a significant amount of human resources and time. Park Systems developed the AFM systems and SmartScan™ software to address this issue and make AFM systems more user friendly. The Park AFM system is easy to use and even an novice user can generate high-quality AFM images with a few mouse clicks using SmartScanTM software.In this webinar, we will introduce you to the SmartScan™ AFM operating software and overall user interface.