纳米红外光谱分析系统在化学分析及材料成像的应用光诱导力显微镜 (PiFM) 能提供高分辨率红外光谱,其与传统的FTIR(傅里叶变换红外光谱)保持着密切的相关性,结合AFM 平台,其PiFM 光谱 可达10 nm 空间分辨率下的化学鉴定。此外,Park PiFM 亦可提供不同深度的光谱信息,提供对样品成分的更多资讯。
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
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- 이벤트
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- 전문가 코너
- Analyze Cells
- Programs
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- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
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