Nano Academy
Imaging spectroscopic ellipsometry involves combining the sensitivity of ellipsometry to detect changes in film thickness and optical properties with the imaging capabili...
High Aspect Ratio Structure
High Aspect Ratio Structure – Deep Trench Nanometrology
Figure 1 shows a 50nm wide silicon trench, with aspect ratio over 2 and sidew...
New 3-Dimensional AFM for CD Measurement and Sidewall Characterization
Yueming Hua, Cynthia Buenviaje-CogginsPark Systems Inc. 3040 Olcott St. Santa Clara, CA 95054, U...
30
Nov -0001'
SICM
Brian Choi, Bio-application scientistFor more information, please contact app@parksystems.comData Reference: Dr. Futwan, King Faisal Specialist Hospital and research cent...
30
Nov -0001'
AFM
Brian Choi, Bio-application scientistFor more information, please contact app@parksystems.comSample courtesy: Prof. Tong-mook Kang, Sungkyunkwan Univ)
Cells communica...
Dr Zakhar Kudrynskyi is a Research Fellow at the Faculty of Engineering, the University of Nottingham, UK. He studied at Chernivtsi National University in Ukraine where h...
Introduction
Perovskites are a class of materials that have emerged as promising candidates for use in photovoltaic cells, which are devices that convert light energy in...
30
Nov -0001'
SICM
Brian Choi, Bio-application scientistFor more information, please contact app@parksystems.comReference: Bing-Chen L., Douglas C. E., Heping M. (2013) SICM a nanotechnolog...
30
Nov -0001'
AFM
Brian Choi, Bio-application scientistFor more information, please contact app@parksystems.comReference: Philippe Pittet, et al. (2008),Fibrogenic fibroblasts increase int...
Israel Ibukun Olaniyan is a Ph.D. candidate at the Free University of Berlin and Helmholtz Zentrum Berlin in Professor Catherine Dubourdieu’s group. Prior to starting his...