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Nanomechanical Properties of Lipid Vesicles Using Atomic Force Microscopy
Designing a New Class of Atomic Force Microscope –Park FX40 The Automatic AFM
Quantit...
Valerio Levati is a Ph.D. student at the Physics Department of Politecnico di Milano. He received both his B.Sc. and M.Sc. in Engineering Physics from the same university...
Atomic Force Microscopy – Scanning Electrochemical Microscopy (AFM-SECM): measurements in a glovebox
Sven Daboss1, Christine Kranz1 1Institute of Analytical and Bioanalytical Chemistry, Ulm University, D-89081 Ulm, Germany
Introduction
Correlating electrochemical with ...
Targeted Patch Clamping with Scanning Ion Conductance Microscopy
Myung Hoon Choi, Goo Eun Jung (Research Product Management, Research & Development of Park Systems...
Surface Topography Considerations of Patterned Sapphire Substrates
General Considerations
Nitride-based semiconductor materials (i.e., GaN, InGaN, AlN) have attrac...
Thin Films Nanolithography (XEL)
Thin Films Nanolithography (XEL)
Scanning Probe Nanolithography is a very promising technology for nanofabrication. It uses the ...
High Aspect Ratio Structure
High Aspect Ratio Structure – Deep Trench Nanometrology
Figure 1 shows a 50nm wide silicon trench, with aspect ratio over 2 and sidew...
New 3-Dimensional AFM for CD Measurement and Sidewall Characterization
Yueming Hua, Cynthia Buenviaje-CogginsPark Systems Inc. 3040 Olcott St. Santa Clara, CA 95054, U...
Department of Electrical Engineering, University of Nebraska-Lincoln USA
Yong Feng Lu
ylu2@unl.edu
Abstract
Recent studies have demonstrated that carbon nano-onio...
Department of Electrical Engineering, University of Nebraska-Lincoln USA
Yong Feng Lu
ylu2@unl.edu
30
Nov -0001'
SICM
Brian Choi, Bio-application scientistFor more information, please contact app@parksystems.comData Reference: Dr. Futwan, King Faisal Specialist Hospital and research cent...