Making the connection. Atomic force microscopy correlates Graphene’s functional properties on the nanoscale
Making the connection. Atomic force microscopy correlates Graphene’s functional properties on the nanoscale Ilka M. Hermes,1 Simonas Krotkus,2 Ben Conran,3 Clifford McAleese,...
Surface Potential Imaging via Sideband Kelvin Probe Force Microscopy
Armando Melgarejo, Ben Schoenek, and Byong Kim Technical Services, Park Systems, Inc., USA Introduction From materials science to biological research, scientists have adopted Kelvin Probe F...
Nanoscale Electrochemistry Study using SECCM Option of Park Systems
Jiali Zhang and Byong Kim Park Systems Inc., Technical Services, Santa Clara, CA USA Introduction The Holy Grail in electrocatalysis and energy storage is to correlate electrochemical activ...
A Comparative Study of Atomic Force Microscopy between AM KPFM and Sideband KPFM, Principles and Applications
Research Application Technology Center, Park Systems Corporation Introduction Since the development of Atomic Force Microscopy (AFM) [1], several measurement modes have been developed to cha...
Improved Electrical Characterization of Advanced Materials in High Vacuum Environment
John Paul Pineda, Charles Kim, and Byong Kim Park Systems, Inc., Santa Clara, CA USA Introduction Sophisticated, high-performing technology often requires electrical components with advance...
Contact AFM Nanolithography Based on Anodic Oxidation
Armando Melgarejo, Ben Schoenek, Jiali Zhang, and Byong Kim Park Systems, Inc., Santa Clara, CA, USA Introduction The field of nanotechnology has diversified into different areas of researc...
Carrier Profiling in High Vacuum Using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Lennaert Wouters1, Albert Minj1,2, Umberto Celano1, Thomas Hantschel1, Wilfried Vandervorst1,2, Kristof Paredis1 1IMEC, Leuven, Belgium 2Department of Physics and Astronomy, University of Leuven, Le...
High Resolution Phase Imaging of Polymer Thin Film Coated on Gold (Au)
High Resolution Phase Imaging of Polymer Thin Film Coated on Gold (Au) John Paul Pineda, Charles Kim, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...
Nanoscale Material Patterning using Atomic Force MicroscopyNano-Lithography
Nanoscale Material Patterning using Atomic Force MicroscopyNano-Lithography John Paul Pineda, Charles Kim, Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...
Electric Force Microscopy of samples having an appreciable impedance
Perovskites responding to light (Credit Greg Stewart/SLAC National Accelerator Laboratory) Ryan P. Dwyer1,2, John A. Marohn1 Summary KPFM experiments are used to image capacitance and surfa...
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