Webinars
Interactive session will consist of demonstrating anodic oxidation and scratching on different samples. Lithography parameters will be explained with emphasis on drawing ...
This webinar will introduce the principles and measurement examples of these application modes. It is expected that the content can be a useful material for gaining knowl...
This webinar introduces three different PFM measurements, from conventional PFM, which has been in use for a long time. And thee contact resonance PFM using harmonics tec...
高分子材料因其优异的力学、低温成型等特性被广泛应用于生产生活中。高分子的单链特性(如主链结构、分子内及分子间作用相互作用等)会极大的影响其宏观材料性能和应用。因此,深入的研究高分子的单链特性对于理解其宏观材料特性以及高分子新材料的设计具有重要的理论指导意义。
&...
In this presentation, we reviewed Park Systems’s mechanical properties measurement using AFM, with a particular emphasis on the “PinPoint nanomechanical mode”.
...
This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.
&nbs...
Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces. In the bias-assisted or anodic oxidation method, a bias vol...
Scanning Capacitance Microscopy (SCM) is an advanced imaging mode of Park AFM used to map various doping levels of non-uniformly doped semiconductor samples.
...
Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized ...
Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples...