AFM イメージ

Polycrystalline CuInP₂S₆ exhibits grain-dependent ferroelectric domains, with topography affecting true piezoresponse contrast.

DFRT-PFM minimizes topography-induced crosstalk through resonance tracking, providing cleaner and more reliable ferroelectric domain imaging compared to CR- and Off-resonance PFM modes.

Scan Conditions

-System: FX40

-Scan Mode: PFM

-Scan Size: 3 µm × 3 µm

-Scan Rate: 0.5 Hz

-Pixels: 128 × 128

-Cantilever: SPARK 70 Pt (k = 2 N/m, f = 70 kHz)

_{* DFRT: Dual Frequency Resonance Tracking}

_{* CR: Contact Resonance}

_{* Off-Resonance}