SiC MOSFET

SiC MOSFET 2

Scanning Conditions

- System: NX-Hivac
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V

Application

Semiconductor

Related Modes

Scanning Spreading Resistance Microscopy (SSRM)

Related Contents

NANO Insights

Advancing Microwave Impedance Microscopy Research: From Research to Reality
Sample Images

Teflon Defect
Sample Images

Cu Pad Wafer
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