Si nanowire on glass

 Si nanowire on glass 2

Scanning Conditions

- System: XE7
- Scan Mode: SThM
- Cantilever: Thermal probe (k=0.25N/m)
- Scan Size: 3.5μm×3.5μm
- Scan Rate: 1Hz
- Pixel: 512×256

Application

Semiconductor

Related Modes

Scanning Thermal Microscopy (SThM)

Related Contents

Sample Images

BN thin film on Si
Sample Images

Carbon Nanotube on Si
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