Tungsten coated wafer

Tungsten coated wafer

Scanning Conditions

- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126

Related Modes

True Non-Contact™ Mode

Related Contents

Sample Images

Laminated Steel
Application Notes

Study of dental implant using Atomic force microscopy
Sample Images

ITO Film Sputter Deposited onto Silicon
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