Monolayer Graphene
Conductive AFM current imaging resolves periodic Moiré patterns on monolayer graphene, revealing local electrical and structural variations.
FFT analysis confirms the characteristic hexagonal lattice symmetry, demonstrating nanoscale electrical and crystallographic characterization.
Scan Conditions
- System: NX10
- Scan Mode: C-AFM
- Scan Size: 500 nm×500 nm, 125 nm×125 nm
- Scan Rate: 1 Hz
- Pixels: 256×256
- Cantilever: PPP-EFM (k=2.8 N/m, f=75 kHz)
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