Nanoscale characterization across several length scales by AFM and fluorescence microscopy

Speaker : Prof. Thorsten Hugel Affiliation : University of Freiburg, Germany Region : Europe Year : 2020 Language : English Explore nanoscale characterization techniques using AFM and fluorescence microscopy to understand material properties crucial for scientific research and technological advancements.

Application

AFM Exclusive

Authors

Dr. Thorsten Hugel

Related Contents

System Webinars

Piezoresponse Force Microscopy: Techniques, Advances, and Recent Applications
Application Notes

Characterizing CTAB Surfactant Adsorption on Single Nanocubes via Correlative in situ AFM and SEM Analysis
Application Notes

Park FX200 The most advanced AFM for 200 mm sample
×