Full control and automation on point with next-gen Atomic Force Microscopy
In this webinar, we will be showing you the advanced features of our next-gen AFM, the Park FX200, that ensure top-notch performance while being user-friendly for researchers of all skill levels.
You will be guided through the in-built advanced AFM modes enabling the user to seamlessly perform complementary topographic, nanomechanical, electrical characterization of the sample of interest.
