Nanoscale Surface Analysis on Battery Materials via Atomic Force Microscopy
SPEAKERS
.jpg)
-
Asher Cho
RE Application Technology Team, Park Systems Corporation
Asher Cho is a member of the Application Technology Team in the Research Equipment Division at Park Systems. He studied physics and later pursued advanced studies in the field of secondary batteries. In his current role, he supports AFM-based measurements, application development, and technical consultation across a range of research fields. His work primarily focuses on the characterization of mechanical properties using atomic force microscopy, including measurement optimization, data analysis, and the development of suitable approaches for different sample types. He also contributes to improving measurement reliability and expanding practical AFM applications.
- Access Speaker Publications
SPEAKERS
-
- Asher Cho
- RE Application Technology Team, Park Systems Corporation
Authors
As demand for higher-performance batteries continues to grow, understanding the nanoscale properties of battery materials is becoming increasingly important. This webinar will introduce how Atomic Force Microscopy (AFM) can characterize battery materials beyond surface topography, providing insights into their structural, mechanical, electrical, and electrochemical properties.
Through practical examples, attendees will explore advanced AFM techniques—including conductive AFM, SSRM, KPFM, PinPoint electrical modes, and electrochemical AFM—for analyzing cathode and anode materials. The session will demonstrate how multimodal AFM analysis can reveal material heterogeneity, conductive pathways, electrode degradation, and interfacial characteristics at the nanoscale.
Related Contents
.jpeg)
×