イベント

Sideband Kelvin Probe Force Microscopy (KPFM) is a new mode from Park Systems that allows simultaneous imaging of topography and surface potential with a high spatial resolution and improved sensitivity compared to conventional lift mode and other KPFM methods. In this method, the topography is detected at the cantilever's resonance, while the KPFM signals are detected at the sideband’s frequency, a few kHz off from the cantilever's resonant frequency. Therefore, both signals can be measured simultaneously, significantly reducing the acquisition time while improving the surface potential imaging sensitivity. This webinar will introduce Sideband KPFM, using F14H20 as an object of study for the surface potential measurements.