Since atomic force microscopy (AFM) is developed, various applications of nanotechnology were established, and those applications have led technological advances in many science fields. Researchers can acquire detailed topography of nanostructure and accurate probe positioning and distance control in nanometer resolution. Based on those benefits from AFM’s practical imaging capability, various applications were developed and enabled many innovative material property characterizations. However, those technological advances by nanotechnology have limited in ambient environment. Very soft samples like biological samples in liquid environment, there is not much successful advances with high impact. Because of unexpected physical contact of AFM tip on sample surface, small and fragile structures can be dragged or scratched. To overcome these limitation, Scanning ion conductance microscopy (SICM) was invented. The SICM uses nano pipette with ~100 nm inner diameter as a probe and the fundamental operation of SICM relies on an ion current that flows between a pipette electrode and a bath electrode. This ion current is used as feedback signal to maintain a constant distance between the nano pipette and the sample, allowing the nano pipette to scan the surface for topography imaging with non-contact. The SICM has the advantage of being able to cover applications that are difficult to apply AFM, so it is being used in various fields such as biology, electrochemistry, material science and battery research.