We will be part of the 5th Microscopy and Microanalysis Workshop in Finland, proudly presented by Top Analytica. This premier event in the microscopy conference landscape will cover vital subjects including coatings technology, cutting-edge imaging methods, material characterization, environmental monitoring, and innovative laboratory techniques. Seize the opportunity to expand your knowledge and connect with industry leaders in Finland.
- Date: 7 – 9 May
- Location: Radisson Blu Marina Palace,Turuk, Finland
Join our team on-site and don’t miss our talk on Thursday, May 8th at 15:10
Title: “Investigating Correlative Properties on the Nanoscale using Atomic Force Microscopy”
Speaker: Dr. Alexander Klasen, Principal Scientist, Park Systems Europe
Co-Author: Dr. Andrea Cerreta, Principal Scientist, Park Systems Europe
Abstract
Developing next-generation battery applications and coatings poses significant challenges due to their complex dependence on many properties. Researchers need to characterize local electronic properties such as the conductance, work function or piezoelectric properties and mechanical properties on the nm scale.
Here, atomic force microscopy (AFM) is a well-established platform that offers a multitude of modes to measure such features. However, typical AFMs require to switch the hardware and cantilever for different modes, leading to potential inconsistencies in measurements and a loss of spatial correlation.
Park Systems’s FX series of AFMs provides a unique solution by enabling correlative measurements of conductive AFM (CAFM), Kelvin Prove Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM) and mechanical analsyis – all on the same location without the need for setup adjustments or cantilever changes. In this talk, we showcase a correlative study on oxide perovskites and 2D heterostructures investigated with CAFM, KPFM, and PFM. We demonstrate how such a streamlined approach along with an automated tip exchange and laser alignment saves valuable research time while providing precise and reliable data and therefore supports the development of high-performance materials for applications in nanotechnology, energy storage, and advanced coatings.